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半導體元件測試排程問題資料集 2009-08-05
   

(link: http://dalab.ie.nthu.edu.tw/news_content.php?id=19)
The following data set is simulated for analyzing semiconductor final testing scheduling problems described in Wu, Jei-Zheng. and Chien, Chen-Fu (2008), “Modeling semiconductor testing job scheduling and dynamic testing machine configuration,” Expert Systems with Applications, 35(1/2):485-496. Two types of data set are collected including the large-scale problems (LSPB) and wide-range (WRPB). Each type of problem is provided with five particular set of data. All data set are stored in text format and can well represent with the free source Notepad++ (http://notepad-plus.sourceforge.net). Please send your suggestions or questions to Jei-Zheng Wu (jzwu@mx.nthu.edu.tw).

Problem Data Set:
SFTSP-LSPB01.txt
SFTSP-LSPB02.txt
SFTSP-LSPB03.txt
SFTSP-LSPB04.txt
SFTSP-LSPB05.txt
SFTSP-WRPB01.txt
SFTSP-WRPB02.txt
SFTSP-WRPB03.txt
SFTSP-WRPB04.txt
SFTSP-WRPB05.txt
 


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